Sony · Filed Jul 14, 2025 · Published Aug 6, 2026 · verified — real USPTO data

Patent: Camera That Reads Light Flickers Catches Factory Defects in Real Time

Most factory cameras take pictures the same way your phone does, snapping full frames many times per second. Sony is patenting a different approach: a sensor that only reacts when something actually changes in its view, which could make catching tiny product defects much faster and cheaper.

Sony Patent: Event-Based Camera for Factory Defect Detection — figure from US 2026/0230720 A1
Figure from the official USPTO publication.
See all 26 drawings from this filing ↓
Publication number US 2026/0230720 A1
Applicant Sony Semiconductor Solutions Corporation
Filing date Jul 14, 2025
Publication date Aug 6, 2026
Inventors Tatsuya Higashisaka, Satoshi Ihara, Takehiro Aoshima
CPC classification 348/294
Grant likelihood Medium
Examiner JERABEK, KELLY L (Art Unit 2699)
Status Docketed New Case - Ready for Examination (May 20, 2026)
Parent application is a National Stage Entry of PCTJP2023046863 (filed 2023-12-27)
Document 20 claims

How Sony's light-change camera spots manufacturing flaws

Imagine a quality inspector on a factory line whose job is to watch thousands of products roll by and spot anything wrong. Today, most automated inspection systems work like a video camera, capturing full images dozens of times per second and then analyzing each one. That's a lot of data to process, and fast-moving lines can still slip defects through.

Sony's patent describes a different kind of camera called an event-based vision sensor. Instead of recording everything all the time, it only reports when the brightness at a specific point in the image actually changes. Think of it like a motion-sensitive light in your hallway: it ignores everything static and only responds when something moves.

The idea is that a defect on a product surface, such as a scratch, dent, or discoloration, creates a distinct pattern of brightness changes as it passes under a light. The system watches for those patterns and flags the product as defective. Because it only processes pixels that change, it can potentially react much faster and use far less computing power than a standard camera setup.

How the sensor turns pixel-level light shifts into defect alerts

The core of the patent is an event-based vision sensor, a type of image sensor that works very differently from a conventional camera. Rather than capturing full image frames at a fixed rate, each pixel in the sensor independently fires an output signal the moment it detects a meaningful change in light intensity. The output is called an event, and the stream of events is called event data.

A control unit (essentially a processor or analysis system) receives that event data and uses it to decide whether a defect is present on the object being inspected. The patent does not prescribe a single detection algorithm, leaving room for a range of approaches from simple threshold rules to machine-learning classifiers.

This architecture has a few practical advantages over frame-based inspection cameras:

  • Latency is very low because there is no need to wait for a full frame to be captured and read out.
  • Data volume is reduced because pixels that see no change send no data.
  • High-speed or high-contrast scenes, common on lit conveyor belts, are handled more naturally because each pixel responds independently at its own speed.

The patent is broad in scope, covering the sensor-plus-controller pairing as a system, the information-processing device on its own, the inspection method, and the software program that implements it.

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What this means for high-speed production line inspection

Factory inspection is a real bottleneck in manufacturing. Conventional machine-vision cameras are fast, but they still generate enormous amounts of redundant image data that takes time and computing power to analyze. Event-based sensors sidestep that by producing data only when something worth examining actually happens, which could allow inspection systems to keep pace with faster production lines without requiring heavier processing hardware.

Sony Semiconductor Solutions already makes image sensors used across industrial, automotive, and consumer markets, so this patent fits a clear line of business. If event-based inspection makes it into production systems, it would likely show up first in precision electronics or semiconductor manufacturing, where defect tolerances are extremely tight and line speeds are high. For the average consumer, the downstream effect would be fewer defective products making it off the factory floor.

Editorial take

This is a focused, sensible patent from a company that actually makes image sensors for a living. Event-based vision is a genuinely different approach to machine vision, not a marketing spin on existing technology, and Sony applying it to industrial inspection is a logical fit. The patent itself is quite broad and foundational, which means it may face scrutiny during examination, but the underlying idea is technically credible and commercially relevant.

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The drawings

26 drawing sheets from US 2026/0230720 A1 · click any drawing to enlarge

Patent filing page

Source. Full patent text and figures from the official USPTO publication PDF.

Editorial commentary on a publicly published patent application. Not legal advice.